An ion-exchange team comparing glass batches needs more than an isolated stress number: it needs to know which sample was measured and how surface compression and depth of layer relate to the process decision. The Jeffoptics JF-2E Glass Surface Stress Meter offers a portable route for this work. JF-2E uses the optical waveguide effect to measure surface stress in chemically tempered and thermally tempered glass. The measurement range is 1000 MPa, and the depth-of-layer range is 100 µm. Check the sample and intended measurement against those ranges before choosing the workflow.
Two quantities, two questions
Surface compression describes the stress at the surface; depth of layer describes a depth associated with the strengthened layer. Record them separately, with their units and the sample identity. A change in either quantity can prompt a review of the relevant ion-exchange conditions, but neither number alone establishes the cause of a change or the finished product’s performance.
The accuracy specification is 20 MPa for stress and 5 µm for depth of layer. JF-2E is a portable version with a 3.5-inch PDA and a 4000 mAh battery. Together, the two listed ranges and the PDA-based workflow give the laboratory a practical starting point for planning a sample comparison.
| JF-2E reference | Listed detail |
|---|---|
| Method | Optical waveguide effect |
| Stress range | 1000 MPa |
| Depth-of-layer range | 100 µm |
| Accuracy specification | 20 MPa stress; 5 µm depth |
| Portable display | 3.5-inch PDA |
Configuration reference: JF-2E official product information, verified July 2026. Review sample composition, treatment, geometry and required range for the proposed application.
Keep the glass mode and inputs with the result
Software provides separate measure and set views, with different measurement interfaces for chemically and thermally tempered glass. The set view includes serial number, thermal-glass measurement selection, glass thickness, photoelastic coefficient, glass-core refractive index, and factor 1. These are meaningful context for a measurement conversation: record the applicable settings and their basis under the laboratory’s own procedure, rather than assuming that two results are comparable because they use the same units.
For a process comparison, pair each result with sample identification, glass composition and thickness, exchange conditions, measurement location and the method used to establish the inputs. A representative control sample and a consistent location plan make changes easier to investigate. The buyer remains responsible for its specification and release decision.
Turn a report requirement into a workflow decision
Decide who needs to review the two quantities, how the laboratory will associate them with samples, and what records the customer expects. The JF-2E provides the stated PDA views; a desired file format, database connection or automated report should be presented as a requirement for review, not assumed to be an existing feature.
If the sample, range or data workflow differs from the listed configuration, Jeffoptics can evaluate a tailored hardware or software project. Supply an example of the desired record and the number of samples and operators involved so feasibility can be discussed.
Request a chemical-glass measurement review
Send glass composition and ion-exchange route, thickness and dimensions, target compression and layer depth, sample photos, desired locations, current method, record format and decision criteria. Include sample volume, quantity, destination, budget and timing. Explore the JF-2E or request a measurement review.
Frequently asked questions
Why retain both surface compression and layer depth?
They describe different aspects of the strengthened surface. Recording both with the sample and process context supports a more useful comparison than an isolated value.
Does the JF-2E automatically export the buyer’s required report?
The listed PDA views do not establish a particular export or report format. Provide the desired output for a software or workflow review.
Post time: Nov-11-2026